Industrial visual inspection must both decide whether a product is defective and localize the defect, yet pixel-level masks are costly to collect at scale. Most anomaly-segmentation methods learn only from defect-free images and score deviations from normality. A true defect and an unusual-but-normal region, however, can both deviate substantially and receive similarly high scores. We propose Contrastive Dual Gaussian Processes (CDGP), a weakly supervised framework that models normal and anomaly inducing-variable predictive distributions over dense tokens. Its posterior-dominance statistic standardizes their predictive-mean difference by the joint predictive uncertainty, providing both spatial evidence and image-level confidence. This evidence complements hierarchical normal-reconstruction residuals for fine localization. All calibration uses training data only, without human pixel annotations or test-time fitting. Across MVTec AD~2, KSDD2, and VisA, CDGP ranks first among the evaluated methods on all MVTec AD~2 localization metrics and is first-place or competitive on KSDD2 and VisA. Factorized and matched linear-head controls delimit the contribution and scope of the linear-kernel Gaussian process (GP) formulation.
Anomaly detectors are hardest to deploy exactly where training data is scarcest: a newly commissioned production line has a handful of verified "golden" samples and no machine-learning engineer on the factory floor. We present a training-free human-in-the-loop framework in which a domain expert corrects a PatchCore detector by direct memory bank editing: no retraining, no gradients, no original training data. A false-positive correction inserts the reviewed image's normal patches through a self-calibrating novelty gate admitting only those beyond the median pool-normal nearest-neighbour distance. From a bank built on only ten golden samples, operator corrections close a median 66% of the gap to an uncorrected fully trained bank (mean 80%, raised by three categories that overshoot parity), significantly improving 12 of 15 MVTec AD categories and harming none: ten samples plus corrections outperform hundreds of samples without them. On already-trained banks the headroom is smaller and concentrated where the bank undersamples normal appearance (gated: toothbrush +0.10, metal nut +0.09, zipper +0.05, screw +0.05), and no category except grid is significantly harmed. Evaluation uses a held-out protocol (20 splits per category, Holm-corrected Wilcoxon), because corrected images entering the bank inflate naive evaluation toward AUROC 1.0 by memorisation. Passive and active querying are statistically indistinguishable; a matched-label-budget control attributes gains to deployment-time label production at 43% of exhaustive-review cost; a defect-memory extension fails decisively. Feedback is simulated from ground truth; live expert trials, where mislabelling is costliest on small banks, remain future work.