From Reconstruction to Interpretation: Zero-Setup Multi-Phase Segmentation of X-ray Tomography Data

X-ray tomography enables nondestructive characterization of material microstructures, while advances in micro-CT imaging have accelerated volumetric data acquisition and reconstruction. However, rapid interpretation remains limited by image segmentation, which often requires manual thresholding, user prompting, or material-specific model training. We present a zero-setup framework for multi-phase segmentation of synchrotron X-ray tomography data that generates interpretable masks for previously unseen datasets without user input or retraining during deployment. The framework combines a material-agnostic mask preparation strategy with a pretrained semantic segmentation network. It represents commonly occurring structural regions as background, sample, bright, dark-gray, light-gray, and porosity masks. Unlike conventional deep learning pipelines that require dataset-specific annotations and retraining, the proposed framework can be applied directly to new scans and produce diagnostic-level segmentations within minutes of reconstruction. This enables rapid assessment of scan quality, sample morphology, porosity, and attenuation variations during ongoing beamline experiments. The generated masks can later be manually refined or used to fine-tune application-specific models when greater accuracy or material-specific labeling is required. Evaluation on held-out synchrotron micro-CT images and qualitative testing on additional datasets demonstrate consistent and physically meaningful segmentations across varying samples and imaging conditions. The framework also substantially outperforms conventional intensity-based thresholding. By connecting high-speed reconstruction with immediate interpretation, the approach supports near-real-time beamline feedback and scalable AI-assisted scientific imaging workflows.

Adaptive Beam Selection for Efficient Scanning Probe Tomography

In X-ray tomography, reconstruction quality generally improves with larger numbers of projections. However, more projections increase experiment costs, acquisition time and the radiation dose imparted to the sample. One mitigation to these trade-offs is to adopt a sequential design of experiments, in which each subsequent measurement is determined as a function of previously acquired data in order to maximize information gain. In practice, a widely used heuristic to maximize information is to align beams with the edges of the sample. A key challenge, however, is that the true sample is unknown, so identifying edge-aligned beams typically requires reconstructing the sample based on available measurements. This work proposes a novel sequential design method that identifies edge-aligned measurements directly from the sinogram, bypassing any reconstruction, thereby improving computational efficiency and reducing the experimental design's susceptibility to reconstruction errors. Our method dynamically selects the next set of measurement beams by maximizing an acquisition function that balances exploration and exploitation over the domain of all possible measurements, improving reconstruction quality while reducing measurement redundancy.