Generative AI can now produce highly realistic images, yet current models still exhibit subtle but critical defects that undermine their reliability. While existing AI-generated image (AGI) evaluation benchmarks have made notable progress, comprehensive AGI defect diagnosis remains underexplored. To bridge this gap, we introduce AGIDefect-4K, a richly annotated dataset of 4,000 images from 15 state-of-the-art generative models spanning both open-source and closed-source systems. AGIDefect-4K features hierarchical defect annotations: (1) detection labels identifying whether defects exist, (2) pixel-level segmentation masks localizing defective regions, and (3) detailed textual explanations characterizing defect types and their perceptual impact. Each image is further annotated with an overall quality score. Building on this, we present AGIDA (AGI Defect Assistant), a baseline framework leveraging Multimodal Large Language Models (MLLMs) for joint defect detection, localization, explanation, and quality prediction. Comprehensive benchmarking on AGIDefect-4K reveals that AGI defect understanding remains challenging, underscoring the value of this dataset. The dataset is publicly available at https://github.com/sxfly99/AGIDefect-4K.
Zhongming Liu, Bingbing Jiang, Guangxin Wan +1cs.CV
Steel surface defect segmentation is critical for industrial quality inspection, yet existing methods struggle with elongated, anisotropic defects such as cracks and scratches due to the isotropic receptive fields of standard convolutions and rigid sampling grids that cannot adapt to irregular defect boundaries. To address these limitations, we propose Strip-based Predictor for Deformable Convolutional Networks (SPDCN) with two key innovations. The \textbf{Fuzzy-enhanced Multi-scale Context Module (FMCM)} employs group-wise multi-branch convolutions with an intuitionistic fuzzy channel attention mechanism to adaptively capture multi-scale contextual information across varying defect sizes. The \textbf{Adaptive Direction-Aware Deformable Convolution (ADADC)} replaces the conventional offset predictor with decoupled horizontal and vertical strip convolutions, enabling the deformable sampling grid to anisotropically align with the principal orientation of elongated defects. Extensive experiments on public steel surface defect benchmarks demonstrate that SPDCN consistently outperforms state-of-the-art methods, achieving 89.60\% mIoU on NEU-Seg with only 3.54M parameters. The source code is publicly available at https://github.com/DWlzm .
Md Mahedi Hasan, Md Mushfiqur Rahaman, Alan Pachkovskiy +3cs.CV cs.LG
Defect segmentation in additive manufacturing (AM) X-ray computed tomography (XCT) images remains challenging due to severe class imbalance and large distribution shifts across scan conditions. Although recent foundation models such as the Segment Anything Model (SAM) provide strong general-purpose segmentation priors, their natural-image pre-training transfers poorly to the AM XCT domain, where defects appear as subtle non-semantic microstructural anomalies. Moreover, adapting SAM to the AM domain is further limited by the large domain gap and scarcity of labeled real XCT data. We present XCT-SAM, a sequential parameter-efficient adaptation framework for AM XCT defect segmentation. Instead of adapting SAM directly from natural images to XCT data, we first fine-tune Conv-LoRA adapters on an alloy-microstructure dataset and subsequently transfer the adapted model to XCT images, progressively bridging the domain gap. Using Conv-LoRA adapters with rank r=2, the framework injects convolutional spatial inductive bias into SAM's backbone while training approximately 4.15M parameters and keeping over 99% of the model frozen. We evaluate XCT-SAM on out-of-distribution CycleGAN-XCT benchmarks and real-world NIST XCT scans. Across both settings, XCT-SAM consistently outperforms zero-shot SAM and other domain-adapted SAM baselines, achieving the best overall IoU and Dice scores. These results demonstrate the effectiveness of intermediate domain adaptation with parameter-efficient adapters for industrial XCT defect segmentation. The source code is publicly available at https://github.com/Mahedi-61/XCT-SAM.git
Surface scratch defects in semiconductor manufacturing pose significant challenges due to their irregular shapes, low contrast, and varying scales. Traditional inspection methods often struggle to detect such defects reliably, especially in complex imaging scenarios. While deep learning approaches based on Convolutional Neural Networks (CNNs) have improved accuracy, they often fail to capture fine-grained edge details. To address these limitations, we propose ScratNet, a novel end-to-end scratch segmentation framework that integrates a modified Swin Transformer backbone with a tailored decoder. The decoder incorporates a Multi-Scale Dilated Aggregation (MDA) module to capture both local and global context, a Stem Integration Module (SIM) to restore spatial detail, and a Precision Refinement (PR) branch that enhances boundary sharpness using anisotropic convolutions. Through this stage-adaptive feature aggregation and boundary-aware refinement, ScratNet achieves superior accuracy on thin and irregular defects. Extensive experiments demonstrate that ScratNet consistently outperforms existing methods, providing a scalable and robust solution for automated scratch inspection in high-precision manufacturing.