ED-CSP: Crystal Structure Prediction from Electron Diffraction

Recovering a periodic 3D crystal structure from sparse, unindexed electron diffraction (ED) observations is a challenging generative inverse problem. Existing ED-based learning methods mainly predict crystallographic labels, reconstruct structures from indexed reflections, or retrieve candidates from finite structure libraries. Here, we introduce ED-CSP, a machine learning framework that predicts crystal structures from chemical composition, atom count, and multiple detector-plane ED spot sets. ED-CSP combines a relational set encoder, permutation-invariant multi-view aggregation, and a periodic flow generator to jointly predict lattice parameters and fractional atomic coordinates. To train the model, we construct ED-CS, a dataset of 4.85 million simulated multi-view ED crystal structures, deduplicated across seven materials repositories and filtered to exclude CHILI-100K overlaps. On 2,075 held-out CHILI-100K materials, ED-CSP trained only on CHILI achieves a structural match rate of 57.49% MR@5, outperforming PXRDGen (52.92%), a state-of-the-art crystal structure prediction model conditioned on powder X-ray diffraction. Scaling training data further improves performance: initializing from a one-million-structure precursor raises MR@5 to 66.27%. On 1,024 compositions absent from the training retrieval library, the model still achieves 53.52% MR@5, demonstrating true generative capability beyond exact-formula retrieval. Replacing target ED observations with diffraction from non-isomorphic structures of identical composition decreases MR@5 by 22.09 percentage points, confirming that predictions depend on the input diffraction patterns rather than composition alone. ED-CSP and ED-CS establish a benchmark for generative crystal structure prediction from sparse ED observations and provide a foundation for future transfer to experimental data.

Mapping Order in Semicrystalline Polymers using Machine Learning of Nanobeam Electron Diffraction

Organic mixed ionic electronic conductors (OMIECs) are a promising class of polymer materials for applications spanning neuromorphic computation to energy efficient electronics and bioelectronics. Despite being highly tunable, the relationship between structural features and key performance properties such as charge carrier mobility is poorly understood. Scanning nanodiffraction in the transmission electron microscope (TEM) is a powerful probe for elucidating this structure-property relationship, but produces large, noisy datasets that are difficult to interpret because polymer reflections exhibit several distinct morphologies. To address the complexity, we trained a machine learning (ML) model to detect these polymer diffraction peaks and their intensities from synthetic data. Compared to correlative peak detection algorithms, the conventional method for analyzing nanobeam 4D scanning transmission electron microscopy (4DSTEM) data, we show that the ML model is significantly faster and outperforms correlative algorithms in almost all cases, opening up the possibility of near-live visualization of 4DSTEM experiments.