Probabilistic Circuits (PCs) are tractable generative models whose internal nodes encode a hierarchy of probabilistic sum- maries over different variable scopes. Existing PC-based out- of-distribution (OOD) detection methods ignore this hierar- chy, reducing the entire circuit to the scalar likelihood (or its uncertainty) computed at the root. We introduce Hierar- chical Likelihood Vector (HLV), a representation whose en- tries are the likelihoods associated with selected PC nodes and define the Hierarchical Likelihood Distance (HLD), a PC-induced pseudo-metric that compares the probability dis- tributions through the expectations of their HLVs. We show that HLD is an integral probability metric over a function class naturally induced by the PC and develop a principled goodness-of-fit hypothesis test for unsupervised OOD detec- tion. Unlike existing approaches, the trained PC alone serves as the representation of the in-distribution: no held-out in- distribution data are required at deployment. We further show that the quantities required by the hypothesis test can be com- puted exactly, directly from the trained circuit, yielding an ap- proximate analytic decision threshold. Experiments on tabular and MNIST datasets demonstrate that exploiting the hierarchi- cal probabilistic summaries encoded through the PC improve OOD detection over root-likelihood, uncertainty-, typicality- and kernel-based baselines, while naturally localizing distri- bution shifts to the PC nodes responsible for the shift.
Detecting distributional differences between two independent samples is a fundamental problem in statistics and machine learning. Nonparametric two-sample testing provides a principled framework for determining whether two samples are drawn from the same underlying distribution, without assuming any specific parametric form for the distribution. In this study, we propose a new two-sample test statistic based on a newly introduced integral probability metric (IPM), using a specially designed parametric discriminator class with a single node of a neural network. We show that the resulting test statistic, called PReLU-IPM, is nonparametric and establish theoretical guarantees for the associated two-sample testing procedure, PReLU-TST, including its consistency and asymptotical equivalence to nonparametric IPM-based tests under regularity conditions. By analyzing multiple simulated and real benchmark datasets, we demonstrate that PReLU-TST achieves higher power across a range of alternatives or performs comparably to its competitors, for finite samples.