Parameterised graph theory for tensor networks: entanglement rerouting, structural simplification, and agnostic tomography

Parameterised graph theory studies how the complexity of graph-theoretic problems depends on structural parameters of the input graph. This perspective has proved useful in analysing tensor-network simulation (Markov and Shi, 2008). Its implications for tensor-network representations and tomography are less well understood. In particular, which graph parameters determine whether a tensor-network state (TNS) admits a tractable matrix product state (MPS) or tree tensor network (TTN) representation, and which control the complexity of learning the state? We address these questions using parameterised graph theory. First, we show that cutwidth and tree-cutwidth bound the bond dimension overhead required to represent a TNS as an MPS or TTN. In the TTN case, tree-cutwidth also bounds the local dimension of the grouped subsystems. The proofs are based on entanglement rerouting, a tensor-network analogue of rerouting information in a classical network. Second, we derive graph-dependent upper bounds on the sample and computational complexity of realisable TNS tomography, with exponents that depend on cutwidth, tree-cutwidth, and a new graph parameter, learning complexity, which we bound in terms of degree and treewidth. We obtain these results by extending the disentangling MPS learner of (Cramer et al., 2010), as analysed further in (Bakshi et al., 2025; Lin et al., 2025), to TTNs and to tensor networks on arbitrary known graphs. Finally, we extend the framework beyond the realisable setting. For an arbitrary input state, our agnostic learner outputs a pure state whose fidelity is within additive error $ε$ of the optimum over tensor-network states on the given graph with a given bond dimension, with explicit graph-dependent bounds on sample and computational complexity.

DeepCormack: Fermi surface tomography using model-based data-driven algorithms

The experimental reconstruction of the 3D two-photon momentum density (TPMD) via angular correlation of electron-positron annihilation radiation (ACAR) is a particularly useful method for studying material Fermi surfaces. It does not rely on low temperatures, UHV conditions, or strong magnetic fields, and enables the study of the spin-resolved electronic structure of materials. Yet, it remains a challenging inverse problem. Typically, 10^8 positron annihilation events are measured for 3--6 projections of the TPMD at different angles. The standard reconstruction approach is an ACAR adaptation of Cormack's method (the MCM) that leverages the inherent symmetry in the crystal's structure. However, the poor signal-to-noise ratio means collecting data of sufficient quality for Fermi surface studies can take months per sample. We present DeepCormack, a family of data-driven model-based reconstruction algorithms that augments the MCM by integrating supervised deep-learning models (CNN, MLP, and UNet) at various stages. To overcome the lack of large experimental training sets, we propose a method which leverages singular value decomposition with dynamic mode decomposition to generate realistic synthetic TPMD volumes, requiring only a single reference momentum density computed via density functional theory. On test data, DeepCormack improves reconstruction quality over MCM by about 8.5 dB PSNR at 200M counts and remains stable at reduced counts, enabling significantly faster acquisition times. Generalisation to experimental data depends strongly on how well the training distribution from the reference momentum density matches the sample. We therefore recommend pairing DeepCormack with a DFT calculation of the target material to create sample-specific training data. Our proposed method offers either much higher quality reconstructions, or enables significantly faster ones, on the order of weeks.

Unsupervised Deep Learning for Limited-Angle STEM-EDX Tomography -- Application to 3D Chemical Analysis of Phase-Change Memory Devices

Energy Dispersive X-ray (EDX) tomography in Scanning Transmission Electron Microscopy (STEM) enables 3D compositional and elemental mapping at the nanoscale, but its use is limited by restricted tilt ranges and low-dose conditions required to avoid beam damage. Limited-angle acquisition introduces missing-wedge artefacts such as elongation and anisotropic resolution, while noisy low-dose data further degrade reconstruction quality and quantitative reliability. Here, we introduce an unsupervised deep learning framework based on Deep Image Prior with total variation regularization (DIP-TV) for limited-angle STEM-EDX tomography. We extend it to a multi-channel formulation (DIPm-TV) that jointly reconstructs multiple elemental maps by exploiting spatial correlations. Using a synthetic 3-channel phantom, we show that the method compensates for severe missing-wedge artefacts corresponding to approximately $100^\circ$ of missing angular range under moderate noise, outperforming simultaneous iterative reconstruction technique and compressed sensing approaches. We apply the method to 3D chemical analysis of Ge-Sb-Te (GST) memory devices in virgin (as-fabricated) and SET (crystalline) operational states. Samples were prepared as cross-sectional focused ion beam lamellae and acquired under a limited-angle tilt range from $-40^\circ$ to $+40^\circ$ with $5^\circ$ steps and a dose of $2.0\times10^5$ $e^-/Ang^2$. The multi-channel approach enables voxel-by-voxel elemental reconstruction using only EDX signals without external structural priors such as high-angle annular dark-field imaging. The reconstructed volumes show near-isotropic spatial resolution and reveal compositional heterogeneities associated with device operation. This approach enables 3D chemical characterization in experimentally accessible sample geometries where conventional methods fail due to severe angular limitations.